Research Paper Detail

Optical and electrical characteristics of 17keV X-rays exposed TiO 2 films and Ag/TiO 2/p-Si MOS device

Publisher: Materials Science in Semiconductor Processing, Pergamon
Publication Year: 2017

First Author:  M Ishfaq Second Author: 
Third Author:  Volume: 
Publication #:  Page #: 
Level:   International Type:  Journal
Prof. Dr. Arshad Saleem Bhatti

Professor/Dean Faculty of Science
Office of Dean Faculty of Science Department
Islamabad Campus

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